Test fails on CLisp

[catap]

I'm using the last available CLisp on macOS 12 from this commit: https://gitlab.com/gnu-clisp/clisp/-/commit/66924971790e4cbee3d58f36e530caa0ad568e5f and tests are failed as:

:info:test Doing 104 pending tests of 104 tests total.
:info:test  :UB16REF/BE :SB16REF/BE :UB32REF/BE :SB32REF/BE :UB64REF/BE :SB64REF/BE
:info:test  :UB16SET/BE :SB16SET/BE :UB32SET/BE :SB32SET/BE :UB64SET/BE :SB64SET/BE
:info:test  :UB16REF/LE :SB16REF/LE :UB32REF/LE :SB32REF/LE :UB64REF/LE :SB64REF/LE
:info:test  :UB16SET/LE :SB16SET/LE :UB32SET/LE :SB32SET/LE :UB64SET/LE :SB64SET/LE
:info:test  :IEEE-SINGLE-REF/BE :IEEE-DOUBLE-REF/BE
:info:test Test :IEEE-SINGLE-SET/BE failed
:info:test Form: (NIBBLES-TESTS::SET-FLOAT-TEST 'NIBBLES:IEEE-SINGLE-REF/BE 32 T)
:info:test Expected value: :OK
:info:test Actual value: #<SIMPLE-ERROR #x0000000000061AD0>.
:info:test  :IEEE-DOUBLE-SET/BE :IEEE-SINGLE-REF/LE :IEEE-DOUBLE-REF/LE
:info:test Test :IEEE-SINGLE-SET/LE failed
:info:test Form: (NIBBLES-TESTS::SET-FLOAT-TEST 'NIBBLES:IEEE-SINGLE-REF/LE 32 NIL)
:info:test Expected value: :OK
:info:test Actual value: #<SIMPLE-ERROR #x0000000000061AD0>.
:info:test  :IEEE-DOUBLE-SET/LE :READ-UB16/BE :READ-SB16/BE :READ-UB32/BE
:info:test  :READ-SB32/BE :READ-UB64/BE :READ-SB64/BE :READ-UB16/LE :READ-SB16/LE
:info:test  :READ-UB32/LE :READ-SB32/LE :READ-UB64/LE :READ-SB64/LE
:info:test  :READ-UB16/BE-VECTOR :READ-SB16/BE-VECTOR :READ-UB32/BE-VECTOR
:info:test  :READ-SB32/BE-VECTOR :READ-UB64/BE-VECTOR :READ-SB64/BE-VECTOR
:info:test  :READ-UB16/LE-VECTOR :READ-SB16/LE-VECTOR :READ-UB32/LE-VECTOR
:info:test  :READ-SB32/LE-VECTOR :READ-UB64/LE-VECTOR :READ-SB64/LE-VECTOR
:info:test  :READ-UB16/BE-LIST :READ-SB16/BE-LIST :READ-UB32/BE-LIST
:info:test  :READ-SB32/BE-LIST :READ-UB64/BE-LIST :READ-SB64/BE-LIST
:info:test  :READ-UB16/LE-LIST :READ-SB16/LE-LIST :READ-UB32/LE-LIST
:info:test  :READ-SB32/LE-LIST :READ-UB64/LE-LIST :READ-SB64/LE-LIST :WRITE-UB16/BE
:info:test  :WRITE-SB16/BE :WRITE-UB32/BE :WRITE-SB32/BE :WRITE-UB64/BE
:info:test  :WRITE-SB64/BE :WRITE-UB16/LE :WRITE-SB16/LE :WRITE-UB32/LE
:info:test  :WRITE-SB32/LE :WRITE-UB64/LE :WRITE-SB64/LE :WRITE-UB16/BE-VECTOR
:info:test  :WRITE-SB16/BE-VECTOR :WRITE-UB32/BE-VECTOR :WRITE-SB32/BE-VECTOR
:info:test  :WRITE-UB64/BE-VECTOR :WRITE-SB64/BE-VECTOR :WRITE-UB16/LE-VECTOR
:info:test  :WRITE-SB16/LE-VECTOR :WRITE-UB32/LE-VECTOR :WRITE-SB32/LE-VECTOR
:info:test  :WRITE-UB64/LE-VECTOR :WRITE-SB64/LE-VECTOR :WRITE-UB16/BE-LIST
:info:test  :WRITE-SB16/BE-LIST :WRITE-UB32/BE-LIST :WRITE-SB32/BE-LIST
:info:test  :WRITE-UB64/BE-LIST :WRITE-SB64/BE-LIST :WRITE-UB16/LE-LIST
:info:test  :WRITE-SB16/LE-LIST :WRITE-UB32/LE-LIST :WRITE-SB32/LE-LIST
:info:test  :WRITE-UB64/LE-LIST :WRITE-SB64/LE-LIST
:info:test 2 out of 104 total tests failed: :IEEE-SINGLE-SET/BE, 
:info:test    :IEEE-SINGLE-SET/LE.
:info:test *** - TEST-OP failed for NIBBLES-TESTS

[phoe]

What is the SIMPLE-ERROR that is being signaled there? Can you call SET-TEST yourself with the proper params and give us the contents of the error and the backtrace?