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EFR32 Unit Test crashes
Problem
EFR32 Unit tests crashes while running:
python -m nl_test_runner.nl_test_runner -d /dev/ttyACM0 -f out/debug/chip-efr32-device_tests.s37 -o out.log
...
<detail> [IN] New secure session created for device 0x0000000006A11E3D, key 2!!
<detail> [IN] New secure session created for device 0x000000000001E306, key 1!!
<info > [IN] Prepared encrypted message 0x20020518 to 0x0000000006A11E3D of type 0xhx and protocolId (1, 0) on exchange 4� with
MessageCounter:105.
<info > [IN] Sending encrypted msg 0x20020518 with MessageCounter:1 to 0x0000000006A11E3D at monotonic time: ld msec
<info > [-]
FREERTOS ASSERT ( (pxLink->xBlockSize & xBlockAllocatedBit) != 0 )
<info > [-]
FREERTOS ASSERT ( ( portNVIC_INT_CTRL_REG & portVECTACTIVE_MASK ) == 0 )
After doing a bisect I think this it was broken by this CL: https://github.com/project-chip/connectedhomeip/commit/d48d75418d885b851ec11be5192d65ab7005bc15
App tests have a harfault during the TestReadInteraction:
SCB->CFSR 0x00000400 SCB->HFSR 0x40000000 SCB->MMFAR 0xe000ed34 SCB->BFAR 0xe000ed38 SP 0x20029190 R0 0x00000f29
R1 0x30bd08fc
R2 0x01200000
R3 0x4fb50847
R12 0xa5a5a5a5
LR 0x000105ad
PC 0x0000f88e
PSR 0x01000000
src/controller/tests/TestDevice.cpp test has hardfault:
SCB->CFSR 0x00000400 SCB->HFSR 0x40000000 SCB->MMFAR 0xe000ed34 SCB->BFAR 0xe000ed38 SP 0x20028c28 R0 0x00001fe5
R1 0x002b1080
R2 0x1180b0f0
R3 0x002b1280
R12 0xa5a5a5a5
LR 0x000126b1
PC 0x00011994
PSR 0x01000000
Test-CHIP-ReliableMessageProtocol test has hardfault:
HardFault:
SCB->CFSR 0x00008200 SCB->HFSR 0x40000000 SCB->MMFAR 0xfa0f02f4 SCB->BFAR 0xfa0f02f4 SP 0x20028fa0 R0 0x00001d7d
R1 0x046803b9
R2 0x0360da22
R3 0xfa0f02f0
R12 0xa5a5a5a5
LR 0x000105ad
PC 0x0000f890
PSR 0x01000000
Still happening, @rgoliver asked to reopen
#14238 disables TestExchangeMgr which hands on EFR32.
@rgoliver Is this still an issue?
@jmartinez-silabs I know you were looking at fixing and re-enabling the broken EFR unit tests, can this be closed?
If fixed two test group if i recall. The others i could not even try to run them or debug because enabling them overdflows the flash space of our devices
That is an issue with running the tests on the device, one option would be to group the tests and build multiple test binaries instead of a single combined one.
This issue has been automatically marked as stale because it has not had recent activity. It will be closed if no further activity occurs.
This stale issue has been automatically closed. Thank you for your contributions.
Likely still an issue
I just tested the tests. They all link but there is an issue with the event loop. The queue gets full and it causes other issues in the exchanges manager from what I can see. I also opened #33373
I should have a few cycles to investigate further.