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TE-16.1: adding defer flush to leave device clean of AFT entries

Open singh-prem opened this issue 5 months ago • 2 comments

  1. TC TE-16.1 was leaving AFT entries after execution of the test. With this PR, we are adding defer flush to leave the device clean of AFT entries.

singh-prem avatar Sep 12 '24 14:09 singh-prem