Intermittent Test: FGEN test AllocateNamedWaveform_WriteNamedWaveformF64_WaveformWrittenSuccessfully

[reckenro]

[ RUN      ] NiFgenDriverApiTest.AllocateNamedWaveform_WriteNamedWaveformF64_WaveformWrittenSuccessfully
unknown file: Failure
C++ exception with description "MAX:  (Hex 0x80040303) Internal error: The requested object was not found in the configuration database. Please note the steps you performed that led to this error and contact technical support at http://ni.com/support.

Component Name: 
File Name: 
Line Number: 0

Status Code: -2147220733" thrown in SetUp().
[  FAILED  ]

Saw it failing intermittently in this PR run.

AB#2530352

[bkeryan]

@reckenro This has the same failure mode as #986, but it's happening in a different test case.

@maxxboehme tried updating NiFgenDriverApiTest to use a 54x3 device, but there were a few test cases that depend on features or behavior that are not present on the 54x3. I think it would make sense to change NiFgenDriverApiTest to use 54x3 and either fix or disable the few test cases that don't work with this model.