SolidStateDetectors.jl
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SquareRootModel: an electric field dependent temperature model
Added the temperature model implemented in siggen.
The parameterization for the longitudinal drift velocity temperature dependence, v_l
, as a function of the electric
field strength, E
, was proposed by M.Ali Omar, Lino Reggiani:
v_l(T) = v_l(T_0)f(T)/f(T_0)
where v_l(T_0) is a known velocity at reference temperature T_0
. The temperature dependence, f(T)
, is parametrized as:
f(T) = V_s(T)\frac{E/E_c(T)}{(1 + (E/E_c(T))^2)^{1/2}}
where
E_c(T) = V_s(T)/\mu_0(T)~, \quad V_s(T) = B\tanh^{1/2}(\theta/2T)~, \quad\mu_0(T) = A/T^P
The four parameters, A
(\mu_0
at T=1
K), P
, B
, \theta
, are different
for electrons and holes. The work was confined to the fields along the <100> axis. Here the same values are assumed for the <111> axis.
println(sim.detector.semiconductor.charge_drift_model.temperaturemodel)
________SquareRootModel________
V_s(T) = Btanh^{1/2}(theta/2T) and mu_0(T) = A/T^P
---Temperature settings---
Crystal temperature: 95.0
Reference temperature: 78.0
---Fitting parameters---
e100 h100
A 5660.0 163000.0
P -1.68 -2.398
B 130000.0 120000.0
theta 200.0 200.0
SSD.scale_to_given_temperature(T(1000), sim.detector.semiconductor.charge_drift_model.temperaturemodel)
(0.71818286f0, 0.71818286f0, 0.62357354f0, 0.62357354f0)